Two-wavelength antireflection film and objective lens coated with two-wavelength antireflection film

ABSTRACT

A two-wavelength antireflection film to prevent light in two-wavelength regions of a deep-ultraviolet region and a region from a visible region to the near-infrared region on a surface of a substrate by coating the two-wavelength antireflection film on the surface of the substrate which penetrates light from the deep-ultraviolet region to the near-infrared region, comprising a first thin film which is formed on the substrate, and has a refractive index of 1.6 to 2.0 and optical film thickness of 0.4λ to 0.7λ for design main wavelength (λ), a second thin film which is formed on the first thin film, and has a refractive index of 1.35 to 1.55 and an optical film thickness of 0.05λ to 0.6λ for the design main wavelength λ, a third thin film which is formed on the second thin film, and has a refractive index of 1.6 to 2.0 and an optical film thickness of 0.1λ to 0.5λ for the design main wavelength λ, and a fourth thin film which is formed on the third thin film, and has a refractive index of 1.35 to 1.55 and an optical film thickness of 0.2λ to 0.35λ for the design main wavelength λ.

BACKGROUND OF THE INVENTION

[0001] 1. Field of the Invention

[0002] The present invention relates to a two-wavelength antireflection film which prevents reflection for two-wavelength regions of a deep-ultraviolet region and a region from a visible region to a near-infrared region, and relates to an objective lens for optical device with a high numerical aperture and a high magnification, on which the two-wavelength antireflection film is coated.

[0003] 2. Description of the Related Art

[0004] Recently, the magnetic head used for the semiconductor such as CPU and the hard disk drive etc. is remarkably downsized, and extremely high resolving power is required, to accurately detect the defect of the product etc. in the inspection apparatus used for these inspections.

[0005] An optical microscope using a visible ray is used for the above-mentioned inspection apparatus in general. In this case, a resolution of the optical microscope is determined by 0.61λ (wavelength/NA) Therefore, it is necessary to enlarge an NA of the objective lens or to shorten the wavelength of the ray in order to obtain an enough resolution.

[0006] However, recently, enlarging NA of object lens is near limitation. Therefore, to obtain further resolving power, a microscope which shortens wavelength, i.e., a DUV microscope which makes resolving power twice or more by using a deep-ultraviolet region (Deep UV), has been put to practical use.

[0007] By the way, the DUV microscope uses the laser and/or a general-purpose arc lamp such as the mercury lamps, as a light source. The laser outputs light with high intensity ray at a specific wavelength, but apparatus thereof becomes large and expensive. On the other hand, the general-purpose arc lamp outputs light with low intensity at a specific wavelength, but apparatus thereof can be downsized and becomes cheap.

[0008] Then, it is noted that the general-purpose arc lamp emits light in wideband. The general-purpose arc lamp, that an optical amount is secured by widening the wavelength region, is considered to be used as a light source. However, when such a general-purpose arc lamp is used as the light source, it is necessary to compensate the chromatic aberration. Therefore, the single lens having the medium with different refractive index, for example, a lens which can compensate the chromatic aberration by bonding, for instance, fluorite glass and quartz glass with the bonding agent has been put to practical use as the DUV objective lens used for the DUV microscope.

[0009] However, irradiation of light in the DUV region degrades the bonding agent to reduce the transmittance of the objective lens in the lens in which fluorite glass and quartz glass are bonded.

[0010] Therefore, recently, as disclosed in, for example, Japanese Patent Application KOKAI Publication No. 11-167067 and Japanese Patent Application KOKAI Publication No. 2001-318317, the objective lens with no bonding to correct the chromatic aberration using a single lens of the medium with a different refractive index (fluorite glass and quartz glass), and to prevent the reduce in transmittance caused by the degradation of the adhesive by not bonding between these single lenses is developed.

[0011] By the way, the objective lens of no bonding as mentioned above is used to observe the sample image by the light of the deep-ultraviolet region wavelength (for instance, 248 nm). In addition, the objective lens of no bonding might be used to correspond also to the automatic focusing by using the light of wavelength from the visible region to the near-infrared region (for instance, 650 to 1000 nm), so-called auto focus function (hereafter, AF).

[0012] In this case, the objective lens should have high transmittance simultaneously with the light of the deep-ultraviolet region wavelength and for the light of wavelength from the visible region to the near-infrared region.

BRIEF SUMMARY OF THE INVENTION

[0013] The two-wavelength antireflection film to prevent light in two-wavelength regions of a deep-ultraviolet region and a region from a visible region to the near-infrared region on a surface of a substrate by coating the two-wavelength antireflection film on the surface of the substrate which penetrates light from the deep-ultraviolet region to the near-infrared region according to one aspect of the present invention is characterized by comprising: a first thin film which is formed on the substrate, and has a refractive index of 1.6 to 2.0 and optical film thickness of 0.4λ to 0.7λ for design main wavelength (λ); a second thin film which is formed on the first thin film, and has a refractive index of 1.35 to 1.55 and an optical film thickness of 0.05λ to 0.6λ for the design main wavelength λ; a third thin film which is formed on the second thin film, and has a refractive index of 1.6 to 2.0 and an optical film thickness of 0.1λ to 0.5λ for the design main wavelength λ; and a fourth thin film which is formed on the third thin film, and has a refractive index of 1.35 to 1.55 and an optical film thickness of 0.2λ to 0.35λ for the design main wavelength λ.

[0014] The objective lens used for an optical equipment, which performs an observation by the light of the deep-ultraviolet region wavelength of 300 nm or less and has a focusing mechanism (auto focus) in the wavelength region from a visible region to a near-infrared region according to one aspect of the present invention is characterized by comprising a plurality of single lenses, wherein each of the plurality of single lenses has a two-wavelength antireflection film according to claim 1 on the surface thereof.

[0015] Advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Advantages of the invention may be realized and obtained by means of the instrumentalities and combinations particularly pointed out hereinafter.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWING

[0016] The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate embodiments of the invention, and together with the general description given above and the detailed description of the embodiments given below, serve to explain the principles of the invention.

[0017]FIG. 1 is a figure showing a schematic configuration of the two-wavelength antireflection film according to the first embodiment of the present invention;

[0018]FIG. 2 is a figure showing spectral reflectance characteristic of two-wavelength antireflection film according to the first embodiment of the present invention;

[0019]FIG. 3 is a figure showing spectral reflectance characteristic of two-wavelength antireflection film according to the second embodiment of the present invention;

[0020]FIG. 4 is a figure showing spectral reflectance characteristic of two-wavelength antireflection film according to the third embodiment of the present invention;

[0021]FIG. 5 is a figure showing change of 246 nm reflectance according to the incident angle in the first to third embodiments of the present invention;

[0022]FIG. 6 is a figure showing spectral reflectance characteristic of two-wavelength antireflection film according to the fourth embodiment of the present invention;

[0023]FIG. 7 is a figure showing spectral reflectance characteristic of two-wavelength antireflection film according to the fifth embodiment of the present invention;

[0024]FIG. 8 is a figure showing spectral reflectance characteristic of two-wavelength antireflection film according to the sixth embodiment of the present invention;

[0025]FIG. 9 is a figure showing change of 248 nm reflectance according to the incident angle in the fourth to seventh embodiments of the present invention;

[0026]FIG. 10 is a figure showing spectral reflectance characteristic of two-wavelength antireflection film according to the seventh embodiment of the present invention;

[0027]FIG. 11 is a figure showing spectral reflectance characteristic of two-wavelength antireflection film according to the eighth embodiment of the present invention;

[0028]FIG. 12 is a figure showing spectral reflectance characteristic of two-wavelength antireflection film according to the ninth embodiment of the present invention;

[0029]FIG. 13 is a figure showing spectral reflectance characteristic of two-wavelength antireflection film according to the tenth embodiment of the present invention;

[0030]FIG. 14 is a figure showing change of 248 nm reflectance according to the incident angle in the eighth to twelfth embodiments of the present invention;

[0031]FIG. 15 is a figure showing spectral reflectance characteristic of two-wavelength antireflection film according to the eleventh embodiment of the present invention;

[0032]FIG. 16 is a figure showing spectral reflectance characteristic of two-wavelength antireflection film according to the twelfth embodiment of the present invention;

[0033]FIG. 17 is a figure showing spectral reflectance characteristic of two-wavelength antireflection film in the first comparison example to explain the present invention;

[0034]FIG. 18 is a figure showing spectral reflectance characteristic of two-wavelength antireflection film in the second comparison example to explain the present invention;

[0035]FIG. 19 is a figure showing a schematic configuration of the objective lens used for the thirteenth embodiment of the present invention;

[0036]FIG. 20 is a figure to explain the angle of the incident (or output) light into (or from) the normal of the lens of the thirteenth embodiment of the present invention;

[0037]FIG. 21 is a figure to explain an example of comparing transmittance of the thirteenth embodiment of the present invention;

[0038]FIG. 22 is a figure showing a schematic configuration of the objective lens used for the fourteenth embodiment of the present invention; and

[0039]FIG. 23 is a figure to explain an example of comparing transmittance of the fourteenth embodiment of the present invention.

DETAILED DESCRIPTION OF THE INVENTION

[0040] Hereinafter, embodiments of the present invention will be explained referring to the drawings.

[0041] (First Embodiment)

[0042]FIG. 1 shows a schematic configuration of the two-wavelength antireflection film to which the first embodiment of the present invention is applied. In FIG. 1, quartz glass, which is transparent from the deep-ultraviolet region to the near-infrared region, is used as a substrate material for the substrate 1. Thin films 2, 3, 4, and 5 are formed on the substrate 1 as two-wavelength antireflection film to form a four-layer structure.

[0043] The film material and the film thickness of each of thin films 2, 3, 4, and 5 is shown in (A) of Table 1. Table 1 collectively shows the film material and the film thickness corresponding to the first to third embodiments ((A) to (C)) as described later TABLE 1 A B C Substrate 1 Quartz glass Quartz glass Quartz glass Design wavelength λ 248 nm 248 nm 248 nm Film Film Film Film thickness thickness thickness material (×λ) Film material (×λ) Film material (×λ) Thin film 2 Al₂O₃ 0.51 Al₂O₃ + La₂O₃ 0.46 Al₂O₃ + La₂O₃ 0.46 (Substance M2) (Substance M3) Thin film 3 MgF₂ 0.46 MgF₂ 0.47 MgF₂ 0.50 Thin film 4 Al₂O₃ 0.16 Al₂O₃ + La₂O₃ 0.26 Al₂O₃ + La₂O₃ 0.16 (Substance M2) (Substance M3) Thin film 5 MgF₂ 0.30 MgF₂ 0.25 MgF₂ 0.30

[0044] In (A) of Table 1, the film materials of thin films 2, 3, 4, and 5, each of which forms each layer, are as follows. Al₂O₃ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the middle refractive index of about 1.7 is used to thin film 2 of the first layer and thin film 4 of the third layer from the substrate 1. MgF₂ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the low refractive index of about 1.4 is used to thin film 3 in the second layer and thin film 5 in the fourth layer from the substrate 1. Each film thickness of these thin films 2, 3, 4, and 5 is shown in (A) of Table 1.

[0045]FIG. 2 shows each spectral reflectance characteristic for the two wavelength antireflection film made for trial purposes with the configuration shown in (A) of Table 1, when changing the incident angle of the light to 0°, 30°, 50°, and 65°, respectively. By changing the incident angle of the light, the curve (a) of FIG. 5 is obtained as a result of simulating the numerical value how the reflectance of the light of design main wavelength (248 nm) is changed.

[0046] As is clear from FIG. 2, it becomes possible to perform antireflection because reflectance becomes small in two-wavelength region in the vicinity of 248 nm and within the range of 650 nm to 800 nm. It is also clear that the reflection of design main wavelength (248 nm) is small in the range of 0° to 70° in incident angle of light as shown in curve (a) of FIG. 5. Therefore, by forming the two-wavelength antireflection film configured with thin films 2, 3, 4, and 5 according to the first embodiment on the substrate 1 of quartz glass which is transparent from the deep-ultraviolet region to the near-infrared region, high transmittance can be achieved for light in the deep-ultraviolet region in the vicinity of design main wavelength (248 nm) and light from the visible region to the near-infrared region in the vicinity of the range of 650 nm to 800 nm, which are used for auto focus.

[0047] (Second Embodiment)

[0048] The schematic configuration of the two-wavelength antireflection film according to the second embodiment is similar to that in FIG. 1, and the explanation will be described by using FIG. 1.

[0049] The film material and the film thickness of each of thin films 2, 3, 4, and 5 of two-wavelength antireflection films configured as FIG. 1 is shown in (B) of Table 1.

[0050] In this case, the film materials of thin films 2, 3, 4, and 5, each of which forms each layer, are as follows The mixture of Al₂O₃ and La₂O₃ with the middle refractive index material is used to thin film 2 of the first layer and thin film 4 of the third layer from the substrate 1. Specifically, Substance M2 made by the Merck, which is the mixture of Al₂O₃ and La₂O₃ whose refractive index is about 1.8 in design main wavelength (248 nm in the deep-ultraviolet region) is used. MgF₂ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the low refractive index of about 1.4 is used to thin film 3 in the second layer and thin film 5 in the fourth layer from the substrate 1 similar to the first embodiment. Each film thickness of these thin films 2, 3, 4, and 5 is shown in (B) of Table 1.

[0051]FIG. 3 shows each spectral reflectance characteristic for the two wavelength antireflection film made for trial purposes with the configuration shown in (B) of Table 1, when changing the incident angle of the light to 0°, 30°, 50°, and 65°, respectively. By changing the incident angle of the light, the curve (b) of FIG. 5 is obtained as a result of simulating the numerical value how the reflectance of the light of design main wavelength (248 nm) is changed.

[0052] As is clear from FIG. 3, it becomes possible to perform antireflection because reflectance becomes small in two- two-wavelength region in the vicinity of 248 nm and within the range of 650 nm to 800 nm. It is also clear that the reflection of design main wavelength (248 nm) is small in the range of 0° to 70° in incident angle of light as shown in curve (b) of FIG. 5.

[0053] Therefore, high transmittance can be achieved for light in the deep-ultraviolet region in the vicinity of design main wavelength (248 nm) and light from the visible region to the near-infrared region in the vicinity of the range of 650 nm to 800 nm, which are used for auto focus similar to that described in the first embodiment.

[0054] (Third Embodiment)

[0055] The schematic configuration of the two-wavelength antireflection film according to the third embodiment is similar to that in FIG. 1, and the explanation will be described by using FIG. 1.

[0056] The film material and the film thickness of each of thin films 2, 3, 4, and 5 of two-wavelength antireflection films configured as FIG. 1 is shown in (C) of Table 1.

[0057] In this case, the film materials of thin films 2, 3, 4, and 5, each of which forms each layer, are as follows. The mixture of Al₂O₃ and La₂O₃ with the middle refractive index material, whose mixture ratio of Al₂O₃ and La₂O₃ and refractive index are different from those in the second embodiment, is used to thin film 2 of the first layer and thin film 4 of the third layer from the substrate 1. Specifically, Substance M3 made by the Merck, which as the mixture of Al₂O₃ and La₂O₃ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is about 1.95, is used. MgF₂ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the low refractive index of about 1.4 is used to thin film 3 in the second layer and thin film 5 in the fourth layer from the substrate 1 similar to the firsts embodiment. Each film thickness of these thin films 2, 3, 4, and 5 is shown in (C) of Table 1.

[0058]FIG. 4 shows each spectral reflectance characteristic for the two wavelength antireflection film made for trial purposes with the configuration shown in (C) of Table 1, when changing the incident angle of the light to 0°, 30°, 50°, and 65°, respectively. By changing the incident angle of the light, the curve (c) of FIG. 5 is obtained as a result of simulating the numerical value how the reflectance of the light of design main wavelength (248 nm) is changed.

[0059] As is clear from FIG. 4, it becomes possible to perform antireflection because reflectance becomes small in two- two-wavelength region in the vicinity of 248 nm and within the range of 650 nm to 800 nm. It is also clear that the reflection of design main wavelength (248 nm) is small in the range of 0° to 70° in incident angle of light as shown in curve (c) of FIG. 5.

[0060] Therefore, high transmittance can be achieved for light in the deep-ultraviolet region in the vicinity of design main wavelength (248 nm) and light from the visible region to the near-infrared region in the vicinity of the range of 650 nm to 800 nm, which are used for auto focus similar to that described in the first embodiment.

[0061] (Fourth Embodiment)

[0062] The schematic configuration of the two-wavelength antireflection film according to the fourth embodiment is similar to that in FIG. 1, and the explanation will be described by using FIG. 1. In this case, fluorite glass, which is transparent from the deep-ultraviolet region to the near-infrared region, is used as a substrate material for the substrate 1.

[0063] The film material and the film thickness of each of thin films 2, 3, 4, and 5 of two-wavelength antireflection films configured as FIG. 1 is shown in (A) of Table 2. Table 2 collectively shows the film material and the film thickness corresponding to the fourth to fifth embodiments ((A) to (C)) as described later. TABLE 2 A B C Substrate 1 Fluorite glass Fluorite glass Fluorite glass Design wavelength λ 248 nm 248 nm 248 nm Film Film Film Film thickness thickness thickness material (×λ) Film material (×λ) Film material (×λ) Thin film 2 Al₂O₃ 0.47 Al₂O₃ + La₂O₃ 0.48 Al₂O₃ + La₂O₃ 0.49 (Substance M2) (Substance M3) Thin film 3 MgF₂ 0.41 MgF₂ 0.44 MgF₂ 0.49 Thin film 4 Al₂O₃ 0.20 Al₂O₃ + La₂O₃ 0.27 Al₂O₃ + La₂O₃ 0.11 (Substance M2) (Substance M3) Thin film 5 MgF₂ 0.27 MgF₂ 0.25 MgF₂ 0.31

[0064] In (A) of Table 2, the film materials of thin films 2, 3, 4, and 5, each of which forms each layer, are similar to the first embodiment. Al₂O₃ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the middle refractive index of about 1.7 is used to thin film 2 of the first layer and thin film 4 of the third layer from the substrate 1. MgF₂ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the low refractive index of about 1.4 is used to thin film 3 in the second layer and thin film 5 in the fourth layer from the substrate 1. Each film thickness of these thin films 2, 3, 4, and 5 is shown in (A) of Table 2.

[0065]FIG. 6 shows spectral reflectance characteristic for the two wavelength antireflection film made for trial purposes with the configuration shown in (A) of Table 2, when the incident angle of light is assumed to be 0° (vertical). By changing the incident angle of the light, the curve (a) of FIG. 9 is obtained as a result of simulating the numerical value how the reflectance of the light of design main wavelength (248 nm) is changed.

[0066] As is clear from FIG. 6, it becomes possible to perform antireflection because reflectance becomes small in two-wavelength region in the vicinity of 248 nm and within the range of 650 nm to 800 nm. It is also clear that the reflection of design main wavelength (248 nm) is small in the range of 0° to 70° in incident angle of light as shown in curve (a) of FIG. 9. As a result, a similar advantage to the first embodiment can be expected.

[0067] (Fifth Embodiment)

[0068] The schematic configuration of the two-wavelength antireflection film according to the fifth embodiment is similar to that in FIG. 1, and the explanation will be described by using FIG. 1. In this case, fluorite glass, which is transparent from the deep-ultraviolet region to the near-infrared region, is used as a substrate material for the substrate 1.

[0069] The film material and the film thickness of each of thin film 2, 3, 4, and 5 of two-wavelength antireflection films configured as FIG. 1 is shown in (B) of Table 2.

[0070] In this case, the film materials of thin films 2, 3, 4, and 5, each of which forms each layer, are similar to the second embodiment. Substance M2 made by the Merck, which is the mixture of Al₂O₃ and La₂O₃ whose refractive index is about 1.8 in design main wavelength (248 nm in the deep-ultraviolet region) is used to thin film 2 of the first layer and thin film 4 of the third layer from the substrate 1. MgF₂ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the low refractive index of about 1.4 is used to thin film 3 in the second layer and thin film 5 in the fourth layer from the substrate 1. Each film thickness of these thin films 2, 3, 4, and 5 is shown in (B) of Table 2.

[0071]FIG. 7 shows spectral reflectance characteristic for the two wavelength antireflection film made for trial purposes with the configuration shown in (B) of Table 2, when the incident angle of light is assumed to be 0° (vertical). By changing the incident angle of the light, the curve (b) of FIG. 9 is obtained as a result of simulating the numerical value how the reflectance of the light of design main wavelength (248 nm) is changed.

[0072] As is clear from FIG. 7, it becomes possible to perform antireflection because reflectance becomes small in two-wavelength region in the vicinity of 248 nm and within the range of 650 nm to 800 nm. It is also clear that the reflection of design main wavelength (248 nm) is small in the range of 0° to 70° in incident angle of light as shown in curve (b) of FIG. 9. As a result, a similar advantage to the second embodiment can be expected.

[0073] (Sixth Embodiment)

[0074] The schematic configuration of the two-wavelength antireflection film according to the sixth embodiment is similar to that in FIG. 1, and the explanation will be described by using FIG. 1. In this case, fluorite glass, which is transparent from the deep-ultraviolet region to the near-infrared region, is used as a substrate material for the substrate 1.

[0075] The film material and the film thickness of each of thin films 2, 3, 4, and 5 of two-wavelength antireflection films configured as FIG. 1 is shown in (C) of Table 2.

[0076] In this case, the film materials of thin films 2, 3, 4, and 5, each of which forms each layer, are similar to the second embodiment. Substance M3 made by the Merck, which is the mixture of Al₂O₃ and La₂O₃ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is about 1.95, is used is used to thin film 2 of the first layer and thin film 4 of the third layer from the substrate 1. MgF₂ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the low refractive index of about 1.4 is used to thin film 3 in the second layer and thin film 5 in the fourth layer from the substrate 1. Each film thickness of these thin films 2, 3, 4, and 5 is shown in (C) of Table 2.

[0077]FIG. 8 shows spectral reflectance characteristic for the two wavelength antireflection film made for trial purposes with the configuration shown in (C) of Table 2, when the incident angle of light is assumed to be 0° (vertical). By changing the incident angle of the light, the curve (c) of FIG. 9 is obtained as a result of simulating the numerical value how the reflectance of the light of design main wavelength (248 nm) is changed.

[0078] As is clear from FIG. 8, it becomes possible to perform antireflection because reflectance becomes small in two-wavelength region in the vicinity of 248 nm and within the range of 650 nm to 800 nm. It is also clear that the reflection of design main wavelength (248 nm) is small in the range of 0° to 70° in incident angle of light as shown in curve (c) of FIG. 9. As a result, a similar advantage the third embodiment can be expected.

[0079] (Seventh Embodiment)

[0080] The schematic configuration of the two-wavelength antireflection film according to the seventh embodiment is similar to that in FIG. 1, and the explanation will be described by using FIG. 1.

[0081] The film material and the film thickness of each of thin films 2, 3, 4, and 5 of two-wavelength antireflection films configured as FIG. 1 is shown in Table 4. TABLE 3 Substrate 1 Quartz glass Design wavelength λ 248 nm Layer number Film (from substrate) Film material thickness (×λ) Thin film 2 Al₂O₃ + La₂O₃ 0.52 (Substance M2) Thin film 3 MgF₂ 0.53 Thin film 4 Al₂O₃ + La₂O₃ 0.29 (Substance M2) Thin film 5 MgF₂ 0.28

[0082] In this case, the film materials of thin films 2, 3, 4, and 5, each of which forms each layer, are similar to the second embodiment Substance M2 made by the Merck, which is the mixture of Al₂O₃ and La₂O₃ whose refractive index is about 1.8 in design main wavelength (248 nm in the deep-ultraviolet region) is used to thin film 2 of the first layer and thin film 4 of the third layer from the substrate 1. MgF₂ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the low refractive index of about 1.4 is used to thin film 3 in the second layer and thin film 5 in the fourth layer from the substrate 1. Each film thickness of these thin films 2, 3, 4, and 5 is shown in Table 3.

[0083]FIG. 10 shows spectral reflectance characteristic for the two wavelength antireflection film made for trial purposes with the configuration shown in Table 3, when the incident angle of light is assumed to be 0° (vertical). By changing the incident angle of the light, the curve (d) of FIG. 9 is obtained as a result of simulating the numerical value how the reflectance of the light of design main wavelength (248 nm) is changed.

[0084] As is clear from FIG. 10, it becomes possible to perform antireflection because reflectance becomes small in two-wavelength region in the vicinity of 248 nm and within the range of 650 nm to 800 nm. Especially, it becomes possible to reduce reflectance further within the range from 30° to 50° in incident angle of design main wavelength (248 nm) as shown in curve (d) of FIG. 9. Therefore, transmittance can be further improved by using such two-wavelength antireflection film.

[0085] (Eighth Embodiment)

[0086] The schematic configuration of the two-wavelength antireflection film according to the eighth embodiment is similar to that in FIG. 1, and the explanation will be described by using FIG. 1. In this case, quartz glass, which is transparent from the deep-ultraviolet region to the near-infrared region, is used as a substrate material for the substrate 1.

[0087] The film material and the film thickness of each of thin films 2, 3, 4, and 5 of two-wavelength antireflection films configured as FIG. 1 is shown in (A) of Table 4. Table 4 collectively shows the film material and the film thickness corresponding to the eighth to tenth embodiments ((A) to (C)) as described later. TABLE 4 A B C Substrate 1 Fluorite glass Fluorite glass Fluorite glass Design wavelength λ 248 nm 248 nm 248 nm Film Film Film Film thickness thickness thickness material (×λ) Film material (×λ) Film material (×λ) Thin film 2 Al₂O₃ 0.60 Al₂O₃ + La₂O₃ 0.67 Al₂O₃ + La₂O₃ 0.59 (Substance M2) (Substance M3) Thin film 3 MgF₂ 0.12 MgF₂ 0.87 MgF₂ 0.98 Thin film 4 Al₂O₃ 0.34 Al₂O₃ + La₂O₃ 0.31 Al₂O₃ + La₂O₃ 0.48 (Substance M2) (Substance M3) Thin film 5 MgF₂ 0.26 MgF₂ 0.30 MgF₂ 0.22

[0088] In this case, the film materials of thin films 2, 3, 4, and 5, each of which forms each layer, are similar to the first embodiment. Al₂O₃ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the middle refractive index of about 1.7 is used to thin film 2 of the first layer and thin film 4 of the third layer from the substrate 1. MgF₂ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the low refractive index of about 1.4 is used to thin film 3 in the second layer and thin film 5 in the fourth layer from the substrate 1. Each film thickness of these thin films 2, 3, 4, and 5 is shown in (A) of Table 4.

[0089]FIG. 11 shows spectral reflectance characteristic for the two wavelength antireflection film made for trial purposes with the configuration shown in (A) of Table 4, when the incident angle of light is assumed to be 0° (vertical). By changing the incident angle of the light, the curve (a) of FIG. 14 is obtained as a result of simulating the numerical value how the reflectance of the light of design main wavelength (248 nm) is changed.

[0090] As is clear from FIG. 11, it becomes possible to perform antireflection because reflectance becomes small in two-wavelength region in the vicinity of 248 nm and within the range of 650 nm to 800 nm. It is also clear that the reflection of design main wavelength (248 nm) is small in the range of 0° to 70° in incident angle of light as shown in curve (a) of FIG. 14. Therefore, if two wavelength antireflection film configured with thin films 2, 3, 4, and 5 of the eighth embodiment is formed on the substrate 1 of quartz glass which is transparent from the deep-ultraviolet region to the near-infrared region, high transmittance can be achieved for light in the deep-ultraviolet region in the vicinity of design main wavelength (248 nm) and light in the visible region used for auto focus within the range of 550 nm to 650 nm different from light from the visible region to the near-infrared region used for auto focus within the range of 650 nm to 800 nm described in the first to seventh embodiments.

[0091] (Ninth Embodiment)

[0092] The schematic configuration of the two-wavelength antireflection film according to the ninth embodiment is similar to that in FIG. 1, and the explanation will be described by using FIG. 1.

[0093] The film material and the film thickness of each of thin films 2, 3, 4, and 5 of two-wavelength antireflection films configured as FIG. 1 is shown in (B) of Table 4.

[0094] In this case, the film materials of thin films 2, 3, 4, and 5, each of which forms each layer, are as follows. The mixture of Al₂O₃ and La₂O₃ with the middle refractive index material is used to thin film 2 of the first layer and thin film 4 of the third layer from the substrate 1. Specifically, Substance M2 made by the Merck, which is the mixture of Al₂O₃ and La₂C₃ whose refractive index is about 1.8 in design main wavelength (248 nm in the deep-ultraviolet region) is used. MgF₂ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the low refractive index of about 1.4 is used to thin film 3 in the second layer and thin film 5 in the fourth layer from the substrate 1 similar to the first embodiment. Each film thickness of these thin films 2, 3, 4, and 5 is shown in (2) of Table 4.

[0095]FIG. 12 shows spectral reflectance characteristic for the two wavelength antireflection film made for trial purposes with the configuration shown in (B) of Table 4, when the incident angle of light is assumed to be 0° (vertical). By changing the incident angle of the light, the curve (b) of FIG. 14 is obtained as a result of simulating the numerical value how the reflectance of the light of design main wavelength (248 nm) is changed.

[0096] As is clear from FIG. 12, it becomes possible to perform antireflection because reflectance becomes small in two-wavelength region within the range of the vicinity of 248 nm and 550 nm to 800 nm. It is also clear that the reflection of design main wavelength (248 nm) is small in the range of 0° to 70° in incident angle of light as shown in curve (b) of FIG. 14. Therefore, high transmittance can be achieved for light in the visible region similarly used for auto focus within the range of light in the deep-ultraviolet region in the vicinity of design main wavelength (248 nm) and 550 nm to 650 nm when having described in the eighth embodiment.

[0097] (Tenth Embodiment)

[0098] The schematic configuration of the two-wavelength antireflection film according to the tenth embodiment is similar to that in FIG. 1, and the explanation will be described by using FIG. 1.

[0099] The film material and the film thickness of each of thin films 2, 3, 4, and 5 of two-wavelength antireflection films configured as FIG. 1 is shown in (C) of Table 4.

[0100] The film materials of thin films 2, 3, 4, and 5, each of which forms each layer, are as follows. Substance M3 made by the Merck, which is the mixture of Al₂O₃ and La₂O₃ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is about 1.95, is used is used to thin film 2 of the first layer and thin film 4 of the third layer from the substrate 1. MgF₂ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the low refractive index of about 1.4 is used to thin film 3 in the second layer and thin film 5 in the fourth layer from the substrate 1. Each film thickness of these thin fills 2, 3, 4, and 5 is shown in (C) of Table 4.

[0101]FIG. 13 shows spectral reflectance characteristic for the two wavelength antireflection film made for trial purposes with the configuration shown in (C) of Table 4, when the incident angle of light is assumed to be 0° (vertical). By changing the incident angle of the light, the curve (c) of FIG. 14 is obtained as a result of simulating the numerical value how the reflectance of the light of design main wavelength (248 nm) is changed.

[0102] As is clear from FIG. 13, it becomes possible to perform antireflection because reflectance becomes small in two-wavelength region in the vicinity of 248 nm and within the range of 650 nm to 800 nm. It is also clear that the reflection of design main wavelength (248 nm) is small in the range of 0° to 70° in incident angle of light as shown in curve (c) of FIG. 14. Therefore, high transmittance can be achieved for light from the visible region used for auto focus in the vicinity of the range of light in the deep-ultraviolet region in the vicinity of design main wavelength (248 nm) and 550 nm to 650 nm to the near-infrared region similar to that described in the eighth embodiment.

[0103] In the above-mentioned first to tenth embodiment, MgF₂ as the low refraction material and Al₂O₃ or the mixture of Al₂O₃ and La₂O₃ as the middle refractive index material is used. It is not limited to this, even when material having similar refractive index to these materials such as a plurality of components selected from group of MgF₂, SiO₂, NaF, LiF, and mixture thereof or compound thereof as the low refractive index material and material one or more components selected from group of Al₂O₃, LaF₃, NdF₃, YF₃, La₂O₃, and mixture thereof or compound thereof as the middle refractive index material is used, and advantages of above mentioned embodiments can be expected.

[0104] (Eleventh Embodiment)

[0105] The schematic configuration of the two-wavelength antireflection film according to the eleventh embodiment is similar to that in FIG. 1, and the explanation will be described by using FIG. 1.

[0106] The film material and the film thickness of each of thin films 2, 3, 4, and 5 of two-wavelength antireflection films configured as FIG. 1 is shown in (A) of Table 5. Table 5 collectively shows the film material and the film thickness corresponding to the fourth and fifth embodiments ((A) and (B)) as described later. TABLE 5 B C Substrate 1 Quartz glass Quartz glass Design wavelength λ 248 nm 248 nm Film Film thickness thickness Film material (×λ) Film material (×λ) Thin film 2 Al₂O₃ + La₂O₃ 0.64 Al₂O₃ + La₂O₃ 0.50 (Substance M2) (Substance M2) Thin film 3 SiO₂ 0.11 SiO₂ 0.19 Thin film 4 Al₂O₃ + La₂O₃ 0.37 Al₂O₃ + La₂O₃ 0.32 (Substance M2) (Substance M2) Thin film 5 MgF₂ 0.28 SiO₂ 0.28

[0107] The film materials of thin films 2, 3, 4, and 5, each of which forms each layer, are as follows. Substance M2 made by the Merck, which is the mixture of Al₂O₃ and La₂O₃ whose refractive index is about 1.8 in design main wavelength (248 nm in the deep-ultraviolet region) is used to thin film 2 of the first layer and thin film 4 of the third layer from the substrate 1. SiO₂ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the low refractive index of about 1.5, is used to thin film 3 in the second layer from the substrate 1. MgF₂ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the low refractive index of about 1.4 is used to thin film 5 in the fourth layer front the substrate 1. Each film thickness of these thin films 2, 3, 4, and 5 is shown in (A) of Table 5.

[0108]FIG. 15 shows spectral reflectance characteristic for the two wavelength antireflection film made for trial purposes with the configuration shown in (A) of Table 5, when the incident angle of light is assumed to be 0° (vertical). By changing the incident angle of the light, the curve (d) of FIG. 14 is obtained as a result of simulating the numerical value how the reflectance of the light of design main wavelength (248 nm) is changed.

[0109] As is clear from FIG. 15, it becomes possible to perform antireflection because reflectance becomes small in two-wavelength region in the vicinity of 248 nm and within the range of 650 nm to 800 nm. It is also clear that the reflection of design main wavelength (248 nm) is small in the range of 0° to 70° in incident angle of light as shown in curve (d) of FIG. 14. As a result, a similar advantage to the first embodiment can be expected.

[0110] (Twelfth Embodiment)

[0111] The schematic configuration of the two-wavelength antireflection film according to the twelfth embodiment is similar to that in FIG. 1, and the explanation will be described by using FIG. 1.

[0112] The film material and the film thickness of each of thin films 2, 3, 4, and 5 of two-wavelength antireflection films configured as FIG. 1 is shown in (B) of Table 5.

[0113] The film materials of thin films 2, 3, 4, and 5, each of which forms each layer, are as follows. Substance M2 made by the Merck, which is the mixture of Al₂O₃ and La₂O₃ whose refractive index is about 1.8 in design main wavelength (248 nm in the deep-ultraviolet region) is used to thin film 2 of the first layer and thin film 4 of the third layer from the substrate 1. SiO₂ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the low refractive index of about 1.5, is used to thin film 3 in the second layer and thin film 5 in the fourth layer from the substrate 1. Each film thickness of these thin films 2, 3, 4, and 5 is shown in (B) of Table 5.

[0114]FIG. 16 shows spectral reflectance characteristic for the two wavelength antireflection film made for trial purposes with the configuration shown in (B) of Table 5, when the incident angle of light is assumed to be 0° (vertical). By changing the incident angle of the light, the curve (e) of FIG. 14 is obtained as a result of simulating the numerical value how the reflectance of the light of design main wavelength (248 nm) is changed.

[0115] As is clear from FIG. 16, it becomes possible to perform antireflection because reflectance becomes small in two-wavelength region in the vicinity of 248 nm and within the range of 650 nm to 800 nm. It is also clear that the reflection of design main wavelength (248 nm) is small in the range of 0° to 70° in incident angle of light as shown in curve (e) of FIG. 14. As a result, a similar advantage to the first embodiment can be expected.

FIRST COMPARISON EXAMPLE

[0116] Next, two-wavelength antireflection film of the film configuration and the design value indicated in Table 6 as a comparison example with two-wavelength antireflection film by each embodiment mentioned above has been examined. The schematic configuration of the two-wavelength antireflection film of this case is similar to that in FIG. 1, and the explanation will be described by using FIG. 1. TABLE 6 Substrate 1 Quartz glass Design wavelength λ 248 nm Layer number Film (from substrate) Film material thickness (×λ) Thin film 2 Al₂O₃ + La₂O₃ 0.96 (Substance M2) Thin film 3 MgF₂ 0.35 Thin film 4 Al₂O₃ + La₂O₃ 0.12 (Substance M2) Thin film 5 MgF₂ 0.29

[0117] In the above-mentioned configuration, substance M2 made by the Merck, which is the mixture of Al₂O₃ and La₂O₃ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is about 1.8, is used to thin film 2 of the first layer and thin film 4 of the third layer from the substrate 1. MgF₂ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the low refractive index of about 1.4 is used to thin film 3 in the second layer and thin film 5 in the fourth layer from the substrate 1 similar to the second embodiment. Each film thickness of these thin films 2, 3, 4, and 5 is shown in Table 6.

[0118]FIG. 17 shows each spectral reflectance characteristic for the two wavelength antireflection film made for trial purposes with the configuration shown in Table 6, when changing the incident angle of the light to 0°, 30°, 50°, and 65°, respectively. By changing the incident angle of the light, the curve (d) of FIG. 5 is obtained as a result of simulating the numerical value how the reflectance of the light of design main wavelength (248 nm) is changed.

[0119] As is clear from FIG. 17, it becomes possible to perform antireflection because reflectance becomes small in two-wavelength region in the vicinity of 248 nm and within the range of 650 nm to 800 nm when the incident angle of light is 00 and 30°. However, reflectance in the vicinity of 248 nm becomes large as the incident angle of light becomes large. Especially, as shown in curve (d) of FIG. 5, when the incident angle becomes 55° or more, the function as the antireflection film is nor obtained at all because the reflectance of 248 nm becomes larger than the substrate on which the film is not coated as shown in curve (e) of FIG. 5.

SECOND COMPARISON EXAMPLE

[0120] Next, two-wavelength antireflection film of the film configuration and the design value indicated in Table 7 as other comparison example with two-wavelength antireflection film by each embodiment mentioned above has been examined. The schematic configuration of the two-wavelength antireflection film of this case is similar to that in FIG. 1, and the explanation will be described by using FIG. 1. TABLE 7 Substrate 1 Quartz glass Design wavelength λ 248 nm Layer number Film (from substrate) Film material thickness (×λ) Thin film 2 Al₂O₃ + La₂O₃ 0.47 (Substance M2) Thin film 3 MgF₂ 0.35 Thin film 4 Al₂O₃ + La₂O₃ 0.13 (Substance M2) Thin film 5 MgF₂ 0.29

[0121] Substance M2 made by the Merck, which is the mixture of Al₂O₃ and La₂o₃ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is about 1.8, is used to thin film 2 of the first layer and thin film 4 of the third layer from the substrate 1. MgF₂ whose refractive index in design main wavelength (248 nm in the deep-ultraviolet region) is the low refractive index of about 1.4 is used to thin film 3 in the second layer and thin film 5 in the fourth layer from the substrate 1. Each film thickness of these thin films 2, 3, 4, and 5 is shown in Table 7.

[0122]FIG. 18 shows spectral reflectance characteristic for the two wavelength antireflection film made for trial purposes with the configuration shown in Table 7, when the incident angle of light is assumed to be 0° (vertical). By changing the incident angle of the light, the curve (f) of FIG. 14 is obtained as a result of simulating the numerical value how the reflectance of the light of design main wavelength (248 nm) is changed.

[0123] As is clear from FIG. 18, it becomes possible to perform antireflection because reflectance becomes small in two-wavelength region in the vicinity of 248 nm and within the range of 650 nm to 800 nm when the incident angle of light is 0°. However, when the incident angle becomes large, the reflectance of 248 nm abruptly becomes large as shown in curve (f) of FIG. 14. Especially, when the incident angle becomes 65° or more, the reflectance of 248 nm becomes large, and becomes larger than the reflectance of the substrate on which the film is not coated as shown in curve (g) of FIG. 14. The function as the antireflection film is not obtained at all.

[0124] Next, the objective lens on which two-wavelength antireflection film mentioned above is actually coated on the surface of the lens will be explained.

[0125] (Thirteenth Embodiment)

[0126]FIG. 19 is a figure showing a schematic configuration of the objective lens applied to the thirteenth embodiment of the present invention.

[0127] The objective lens is used for an optical equipment which observes by the light of wavelength of the ultra-violet region of 300 mm or less and has the mechanism to focus (auto focus) by the light in the wavelength region from a visible region to the near-infrared region. Specifically, light of 248±5 nm in the deep-ultraviolet region as wavelength used for the observation and light of 785 nm in the near-infrared region as wavelength used for auto focus are applied.

[0128] The objective lens has the first lens group 1G and the second lens group G2 arranged between the first lens group 1G and the object as shown in FIG. 19. The first lens group 1G has five single lenses L1 to L5 which include positive lens and negative lens with the different medium and has negative power as a whole. The second lens group 2G has thirteen single lenses L6 to L18 which include positive lens and negative lens with the different medium In the first and second lens group 1G and 2G, the air interval is provided between a positive lens and negative lens.

[0129] Tables 8 to 11 show the angle of the light which is incident (emitted) to (from) the normal of the lens, reflectance and the transmittance, etc. corresponding thereto, which are obtained when two wavelength antireflection film explained in detail in the seventh embodiment is coated to each lens surface of each single lens L1 to L18 for each of NA=09, 0.8, 0.7, and 0.5 of such an objective lens, and the lens data of each single lens L1 to L18 (curvature, thickness, interval, and material name).

[0130] The angle of the light which is incident (emitted) to (from) the normal of the lens is an angle r of the light which is incident (emitted) to (from) normal h of the objective lens L as shown in FIG. 20.

[0131] Reflectance and transmittance are obtained from the value of the incident angle obtained as mentioned above. TABLE 8 Surface Thickness and Incident number Curvature Interval Material Angle Reflectance Transmittance L₁ 1 2.562 2.562 Quartz glass 40 0.476 0.995 2 2.11 0.7 23 0.421 0.996 L₂ 3 −2.503 0.7 Fluorite glass 31 0.329 0.997 4 3.929 5.212314 29 0.057 0.999 L₃ 5 INF 2.786 Fluorite glass 13 1.091 0.989 6 −4.1 0.585821 47 0.68 0.993 L₄ 7 −3.179 1 Quartz glass 61 10.316 0.897 8 13.25 0.205879 53 10823 0.982 L₅ 9 14.51 2.792 Fluorite glass 53 1.787 0.982 10 −8.069 0.135719 16 0.278 0.997 L₆ 11 9.175 4.016 Fluorite glass 43 0.959 0.990 12 −8.107 0.473387 59 2.554 0.974 L₇ 13 −6.806 1 Quartz glass 65 7.46 0.925 14 9.394 0.205775 54 1.668 0.983 L₈ 15 9.73 4.65 Fluorite glass 54 1.709 0.983 16 −7.998 0.105412 53 1.314 0.987 L₉ 17 −8.397 1 Quartz glass 50 0.958 0.990 18 13.99 0.1 40 0.611 0.994 L₁₀ 19 12.513 4.035695 Fluorite glass 43 0.968 0.990 20 −10.732 0.1 39 0.852 0.991 L₁₁ 21 35.892 1 Quartz glass 2 0.079 0.999 22 6.835 0.201239 52 1.419 0.986 L₁₂ 23 6.916 4.203 Fluorite glass 52 1.359 0.986 24 −10.627 0.2075 51 1.626 0.984 L₁₃ 25 −10.072 0.96 Quartz glass 52 1.71 0.983 26 101.798 0.1 7 1.232 0.988 L₁₄ 27 10.53 0.9 Quartz glass 12 0.037 1.000 28 4.509 0.527319 62 9.5 0.905 L₁₅ 29 5.379 2.576 Fluorite glass 52 1.308 0.987 30 −51.505 0.1 16 0.888 0.991 L₁₆ 31 6.736 1.742 Fluorite glass 15 0.157 0.998 32 17.567 0.1 12 0.814 0.992 L₁₇ 33 4.099 1.818 Fluorite glass 15 0.656 0.993 34 9.003 0.10016 21 0.357 0.996 L₁₈ 35 1.883 1.872 Quartz glass 17 0.27 0.997 36 5.293 0.262779 58 2.765 0.972

[0132] TABLE 9 Surface Thickness and Incident number Curvature Interval Material Angle Reflectance Transmittance L₁ 1 2.562 2.562 Quartz glass 35 0.774 0.993 2 2.11 0.7 21 0.195 0.998 L₂ 3 −2.503 0.7 Fluorite glass 26 0.091 0.999 4 3.929 5.212314 26 0.122 0.999 L₃ 5 INF 2.786 Fluorite glass 12 1.12 0.989 6 −4.1 0.585821 41 0.702 0.993 L₄ 7 −3.179 1 Quartz glass 53 2.825 0.972 8 13.25 0.205879 44 0.541 0.995 L₅ 9 14.51 2.792 Fluorite glass 43 0.435 0.996 10 −8.069 0.135719 15 0.019 1.000 L₆ 11 9.175 4.016 Fluorite glass 36 0.616 0.994 12 −8.107 0.473387 46 1.128 0.989 L₇ 13 −6.806 1 Quartz glass 51 1.157 0.988 14 9.394 0.205775 41 0.845 0.992 L₈ 15 9.73 4.65 Fluorite glass 41 0.82 0.992 16 −7.998 0.105412 42 0.931 0.991 L₉ 17 −8.397 1 Quartz glass 40 0.881 0.991 18 13.99 0.1 31 0.079 0.999 L₁₀ 19 12.513 4.035695 Fluorite glass 33 0.196 0.998 20 −10.732 0.1 31 0.329 0.997 L₁₁ 21 35.892 1 Quartz glass 2 1.029 0.990 22 6.835 0.201239 42 0.77 0.992 L₁₂ 23 6.916 4.203 Fluorite glass 42 0.77 0.992 24 −10.627 0.2075 41 0.648 0.994 L₁₃ 25 −10.072 0.96 Quartz glass 41 0.686 0.993 26 101.798 0.1 6 1.25 0.988 L₁₄ 27 10.53 0.9 Quartz glass 10 0.178 0.998 28 4.509 0.527319 49 0.881 0.991 L₁₅ 29 5.379 2.576 Fluorite glass 42 0.77 0.992 30 −51.505 0.1 15 1.032 0.990 L₁₆ 31 6.736 1.742 Fluorite glass 12 0.021 1.000 32 17.567 0.1 12 0.912 0.991 L₁₇ 33 4.099 1.818 Fluorite glass 12 0.333 0.997 34 9.003 0.10016 20 0.465 0.995 L₁₈ 35 1.883 1.872 Quartz glass 13 0.68 0.993 36 5.293 0.262779 50 0.893 0.991

[0133] TABLE 10 Surface Thickness and Incident number Curvature Interval Material Angle Reflectance Transmittance L₁ 1 2.562 2.562 Quartz glass 30 00.604 0.994 2 2.11 0.7 19 0.04 1.000 L₂ 3 −2.503 0.7 Fluorite glass 23 0.04 1.000 4 3.929 5.212314 23 0.235 0.998 L₃ 5 INF 2.786 Fluorite glass 11 1.15 0.989 6 −4.1 0.585821 36 0.788 0.992 L₄ 7 −3.179 1 Quartz glass 46 0.59 0.994 8 13.25 0.205879 37 0.155 0.998 L₅ 9 14.51 2.792 Fluorite glass 36 0.134 0.999 10 −8.069 0.135719 13 0.023 1.000 L₆ 11 9.175 4.016 Fluorite glass 30 0.151 0.998 12 −8.107 0.473387 38 0.65 0.990 L₇ 13 −6.806 1 Quartz glass 42 0.959 0.994 14 9.394 0.205775 33 0.227 0.990 L₈ 15 9.73 4.65 Fluorite glass 33 0.196 0.998 16 −7.998 0.105412 34 0.527 0.995 L₉ 17 −8.397 1 Quartz glass 33 0.411 0.996 18 13.99 0.1 25 0.135 0.999 L₁₀ 19 12.513 4.035695 Fluorite glass 27 0.064 0.999 20 −10.732 0.1 26 0.046 1.000 L₁₁ 21 35.892 1 Quartz glass 1 1.189 0.988 22 6.835 0.201239 35 0.728 0.993 L₁₂ 23 6.916 4.203 Fluorite glass 35 0.709 0.993 24 −10.627 0.2075 33 0.122 0.999 L₁₃ 25 −10.072 0.96 Quartz glass 34 0.143 0.999 26 101.798 0.1 5 1.268 0.987 L₁₄ 27 10.53 0.9 Quartz glass 9 0.443 0.996 28 4.509 0.527319 40 0.725 0.993 L₁₅ 29 5.379 2.576 Fluorite glass 34 0.698 0.993 30 −51.505 0.1 13 1.091 0.989 L₁₆ 31 6.736 1.742 Fluorite glass 9 0.105 0.999 32 17.567 0.1 11 1.146 0.989 L₁₇ 33 4.099 1.818 Fluorite glass 9 0.056 0.999 34 9.003 0.10016 17 0.75 0.993 L₁₈ 35 1.883 1.872 Quartz glass 10 0.573 0.994 36 5.293 0.262779 42 0.288 0.997

[0134] TABLE 11 Surface Thickness and Incident number Curvature Interval Material Angle Reflectance Transmittance L₁ 1 2.562 2.562 Quartz glass 21 0.027 1.000 2 2.11 0.7 14 0.277 0.997 L₂ 3 −2.503 0.7 Fluorite glass 16 0.436 0.996 4 3.929 5.212314 17 0.657 0.993 L₃ 5 INF 2.786 Fluorite glass 8 1.215 0.988 6 −4.1 0.585821 25 0.091 0.999 L₄ 7 −3.179 1 Quartz glass 32 0.637 0.994 8 13.25 0.205879 25 0.433 0.996 L₅ 9 14.51 2.792 Fluorite glass 24 0.474 0.995 10 −8.069 0.135719 10 1.282 0.987 L₆ 11 9.175 4.016 Fluorite glass 20 0.255 0.997 12 −8.107 0.473387 25 0.071 0.999 L₇ 13 −6.806 1 Quartz glass 27 0.051 0.999 14 9.394 0.205775 21 0.231 0.998 L₈ 15 9.73 4.65 Fluorite glass 21 0.29 0.997 16 −7.998 0.105412 23 0.074 0.999 L₉ 17 −8.397 1 Quartz glass 22 0.119 0.999 18 13.99 0.1 16 0.693 0.993 L₁₀ 19 12.513 4.035695 Fluorite glass 17 0.568 0.994 20 −10.732 0.1 17 0.28 0.997 L₁₁ 21 35.892 1 Quartz glass 1 0.189 0.998 22 6.835 0.201239 23 0.034 1.000 L₁₂ 23 6.916 4.203 Fluorite glass 23 0.034 1.000 24 −10.627 0.2075 22 0.395 0.996 L₁₃ 25 −10.072 0.96 Quartz glass 22 0.326 0.997 26 101.798 0.1 3 1.28 0.987 L₁₄ 27 10.53 0.9 Quartz glass 6 0.844 0.992 28 4.509 0.527319 26 0.144 0.999 L₁₅ 29 5.379 2.576 Fluorite glass 22 0.035 1.000 30 −51.505 0.1 9 1.197 0.988 L₁₆ 31 6.736 1.742 Fluorite glass 6 0.6 0.994 32 17.567 0.1 8 1.11 0.989 L₁₇ 33 4.099 1.818 Fluorite glass 6 0.274 0.997 34 9.003 0.10016 12 1.015 0.990 L₁₈ 35 1.883 1.872 Quartz glass 6 0.018 1.000 36 5.293 0.262779 28 0.476 0.995

[0135] Thus, the transmittance at wavelength 248 nm and NA=0.9 shown in Table 8 becomes 53.8%. Similarly, the transmittance at wavelength 248 nm and NA=0.8 shown in Table 9 becomes 77.7%. The transmittance at wavelength 248 nm and NA=0.7 shown in Table 10 becomes 84.2%. The transmittance at wavelength 248 nm and NA=0.5 shown in Table 11 becomes 85%.

[0136] On the other hand, Tables 12 to 15 show the angle of the light which is incident (emitted) to (from) the normal of the lens, reflectance and the transmittance, etc. corresponding thereto, which are obtained when two wavelength antireflection film explained in detail in the first comparison example is provided to each lens surface of each single lens L1 to L18 for each of NA=0.9, 10.8, 0.7, and 0.5 of such an objective lens, and the lens data of each single lens L1 to L18 (curvature, thickness, interval, and material name). TABLE 12 Surface Thickness and Incident number Curvature Interval Material Angle Reflectance Transmittance L₁ 1 2.562 2.562 Quartz glass 40 12.006 0.880 2 2.11 0.7 23 4.17 0.958 L₂ 3 −2.503 0.7 Fluorite glass 31 3.548 0.965 4 3.929 5.212314 29 0.916 0.991 L₃ 5 INF 2.786 Fluorite glass 13 0.02 1.000 6 −4.1 0.585821 47 13.356 0.866 L₄ 7 −3.179 1 Quartz glass 61 12.418 0.876 8 13.25 0.205879 53 9.536 0.905 L₅ 9 14.51 2.792 Fluorite glass 53 9.126 0.909 10 −8.069 0.135719 16 2.994 0.970 L₆ 11 9.175 4.016 Fluorite glass 43 10.694 0.893 12 −8.107 0.473387 59 17.194 0.828 L₇ 13 −6.806 1 Quartz glass 65 17.58 0.824 14 9.394 0.205775 54 15.092 0.849 L₈ 15 9.73 4.65 Fluorite glass 54 14.998 0.850 16 −7.998 0.105412 53 14.768 0.852 L₉ 17 −8.397 1 Quartz glass 50 14.076 0.859 18 13.99 0.1 40 5.229 0.948 L₁₀ 19 12.513 4.035695 Fluorite glass 43 8.244 0.918 20 −10.732 0.1 39 8.632 0.914 L₁₁ 21 35.892 1 Quartz glass 2 0.026 1.000 22 6.835 0.201239 52 13.928 0.861 L₁₂ 23 6.916 4.203 Fluorite glass 52 14.038 0.860 24 −10.627 0.2075 51 11.992 0.880 L₁₃ 25 −10.072 0.96 Quartz glass 52 13.038 0.870 26 101.798 0.1 7 0.032 1.000 L₁₄ 27 10.53 0.9 Quartz glass 12 0.51 0.995 28 4.509 0.527319 62 13.7 0.863 L₁₅ 29 5.379 2.576 Fluorite glass 52 14.144 0.859 30 −51.505 0.1 16 0.0085 1.000 L₁₆ 31 6.736 1.742 Fluorite glass 15 2.163 0.978 32 17.567 0.1 12 0.006 1.000 L₁₇ 33 4.099 1.818 Fluorite glass 15 6.229 0.938 34 9.003 0.10016 21 0.079 0.999 L₁₈ 35 1.883 1.872 Quartz glass 17 10.502 0.895 36 5.293 0.262779 58 10.261 0.897

[0137] TABLE 13 Surface Thickness and Incident number Curvature Interval Material Angle Reflectance Transmittance L₁ 1 2.562 2.562 Quartz glass 35 9.479 0.905 2 2.11 0.7 21 2.506 0.975 L₂ 3 −2.503 0.7 Fluorite glass 26 1.75 0.983 4 3.929 5.212314 26 0.402 0.996 L₃ 5 INF 2.786 Fluorite glass 12 0.022 1.000 6 −4.1 0.585821 41 11.585 0.884 L₄ 7 −3.179 1 Quartz glass 53 12.649 0.874 8 13.25 0.205879 44 3.864 0.961 L₅ 9 14.51 2.792 Fluorite glass 43 3.204 0.968 10 −8.069 0.135719 15 0.886 0.991 L₆ 11 9.175 4.016 Fluorite glass 36 5.7 0.943 12 −8.107 0.473387 46 11.252 0.887 L₇ 13 −6.806 1 Quartz glass 51 14.298 0.857 14 9.394 0.205775 41 7.34 0.927 L₈ 15 9.73 4.65 Fluorite glass 41 7.022 0.930 16 −7.998 0.105412 42 10.306 0.897 L₉ 17 −8.397 1 Quartz glass 40 8.73 0.913 18 13.99 0.1 31 1.38 0.986 L₁₀ 19 12.513 4.035695 Fluorite glass 33 2.464 0.975 20 −10.732 0.1 31 3.548 0.965 L₁₁ 21 35.892 1 Quartz glass 2 0.026 1.000 22 6.835 0.201239 42 11.607 0.884 L₁₂ 23 6.916 4.203 Fluorite glass 42 11.607 0.884 24 −10.627 0.2075 41 5.334 0.947 L₁₃ 25 −10.072 0.96 Quartz glass 41 5.678 0.943 26 101.798 0.1 6 0.034 1.000 L₁₄ 27 10.53 0.9 Quartz glass 10 0.145 0.999 28 4.509 0.527319 49 13.44 0.866 L₁₅ 29 5.379 2.576 Fluorite glass 42 11.607 0.884 30 −51.505 0.1 15 0.0148 1.000 L₁₆ 31 6.736 1.742 Fluorite glass 12 0.868 0.991 32 17.567 0.1 12 0.01 1.000 L₁₇ 33 4.099 1.818 Fluorite glass 12 3.288 0.967 34 9.003 0.10016 20 0.0315 1.000 L₁₈ 35 1.883 1.872 Quartz glass 13 8.304 0.917 36 5.293 0.262779 50 4.377 0.956

[0138] TABLE 14 Surface Thickness and Incident number Curvature Interval Material Angle Reflectance Transmittance L₁ 1 2.562 2.562 Quartz glass 30 5.862 0.941 2 2.11 0.7 19 1.2252 0.988 L₂ 3 −2.503 0.7 Fluorite glass 23 0.717 0.993 4 3.929 5.212314 23 0.181 0.998 L₃ 5 INF 2.786 Fluorite glass 11 0.25 0.998 6 −4.1 0.585821 36 8.619 0.914 L₄ 7 −3.179 1 Quartz glass 46 13.062 0.869 8 13.25 0.205879 37 1.346 0.987 L₅ 9 14.51 2.792 Fluorite glass 36 1.148 0.989 10 −8.069 0.135719 13 0.662 0.993 L₆ 11 9.175 4.016 Fluorite glass 30 2.228 0.978 12 −8.107 0.473387 38 5.819 0.942 L₇ 13 −6.806 1 Quartz glass 42 9.288 0.907 14 9.394 0.205775 33 2.72 0.973 L₈ 15 9.73 4.65 Fluorite glass 33 2.447 0.976 16 −7.998 0.105412 34 5.018 0.950 L₉ 17 −8.397 1 Quartz glass 33 4.12 0.959 18 13.99 0.1 25 0.32 0.997 L₁₀ 19 12.513 4.035695 Fluorite glass 27 0.708 0.993 20 −10.732 0.1 26 1.18 0.988 L₁₁ 21 35.892 1 Quartz glass 1 0.033 1.000 22 6.835 0.201239 35 7.157 0.928 L₁₂ 23 6.916 4.203 Fluorite glass 35 6.861 0.931 24 −10.627 0.2075 33 1.76 0.982 L₁₃ 25 −10.072 0.96 Quartz glass 34 1.95 0.981 26 101.798 0.1 5 0.0359 1.000 L₁₄ 27 10.53 0.9 Quartz glass 9 0.019 1.000 28 4.509 0.527319 40 11.156 0.888 L₁₅ 29 5.379 2.576 Fluorite glass 34 6.839 0.932 30 −51.505 0.1 13 0.02 1.000 L₁₆ 31 6.736 1.742 Fluorite glass 9 0.25 0.998 32 17.567 0.1 11 0.019 1.000 L₁₇ 33 4.099 1.818 Fluorite glass 9 1.33 0.987 34 9.003 0.10016 17 0.006 1.000 L₁₈ 35 1.883 1.872 Quartz glass 10 5.136 0.949 36 5.293 0.262779 42 1.632 0.984

[0139] TABLE 15 Surface Thickness and Incident number Curvature Interval Material Angle Reflectance Transmittance L₁ 1 2.562 2.562 Quartz glass 21 0.938 0.991 2 2.11 0.7 14 0.084 0.999 L₂ 3 −2.503 0.7 Fluorite glass 16 0.032 1.000 4 3.929 5.212314 17 0.008 1.000 L₃ 5 INF 2.786 Fluorite glass 8 0.031 1.000 6 −4.1 0.585821 25 1.769 0.982 L₄ 7 −3.179 1 Quartz glass 32 6.208 0.938 8 13.25 0.205879 25 0.0686 0.999 L₅ 9 14.51 2.792 Fluorite glass 24 0.057 0.999 10 −8.069 0.135719 10 0.04 1.000 L₆ 11 9.175 4.016 Fluorite glass 20 0.12 0.999 12 −8.107 0.473387 25 0.503 0.995 L₇ 13 −6.806 1 Quartz glass 27 1.154 0.988 14 9.394 0.205775 21 0.16 0.998 L₈ 15 9.73 4.65 Fluorite glass 21 0.115 0.999 16 −7.998 0.105412 23 0.483 0.995 L₉ 17 −8.397 1 Quartz glass 22 0.337 0.997 18 13.99 0.1 16 0.005 1.000 L₁₀ 19 12.513 4.035695 Fluorite glass 17 0.014 1.000 20 −10.732 0.1 17 0.044 1.000 L₁₁ 21 35.892 1 Quartz glass 1 0.033 1.000 22 6.835 0.201239 23 0.85 0.992 L₁₂ 23 6.916 4.203 Fluorite glass 23 0.85 0.992 24 −10.627 0.2075 22 0.074 0.999 L₁₃ 25 −10.072 0.96 Quartz glass 22 0.106 0.999 26 101.798 0.1 3 0.0371 1.000 L₁₄ 27 10.53 0.9 Quartz glass 6 0.009 1.000 28 4.509 0.527319 26 2.185 0.978 L₁₅ 29 5.379 2.576 Fluorite glass 22 0.076 0.992 30 −51.505 0.1 9 0.029 1.000 L₁₆ 31 6.736 1.742 Fluorite glass 6 0.005 1.000 32 17.567 0.1 8 0.025 1.000 L₁₇ 33 4.099 1.818 Fluorite glass 6 0.07 0.999 34 9.003 0.10016 12 0.016 1.000 L₁₈ 35 1.883 1.872 Quartz glass 6 0.772 0.992 36 5.293 0.262779 28 0.105 0.999

[0140] Thus, the transmittance at wavelength 248 nm and NA=0.9 shown in Table 12 becomes 3.8%. Similarly, the transmittance at wavelength 248 nm and NA=0.8 shown in Table 13 becomes 12.9%. The transmittance at wavelength 248 nm and NA=0.7 shown in Table 14 becomes 31.6%. The transmittance at wavelength 248 nm and NA=0.5 shown in Table 15 becomes 83.5%.

[0141] As a result, when comparing the transmittance of the objective lens of the seventh embodiment in which two wavelength antireflection film is coated and the objective lens of the first comparison example in which two wavelength antireflection film is coated with each lens surface of each single lens L1 to L18, when two wavelength antireflection film of the seventh embodiment as shown in FIG. 21 is coated, high transmittance can be obtained even when NA is 0.9, 0.8, 0.7, and 0.5 as shown in curve A. In contrast, when two-wavelength antireflection film of the first comparison example is applied, it is apparent that transmittance reduces rapidly as shown in curve B as NA becomes large such as 0.7, 0.8, 0.9 as shown in curve B. As a result, high transmittance in 248 nm used for the observation and a high NA, that is, high resolutions can be achieved by coating two-wavelength antireflection film according to the seventh embodiment to each lens surface of each single lens L1 to L18 which configures the objective lens.

[0142] (Fourteenth Embodiment)

[0143]FIG. 22 is a figure showing a schematic configuration of the objective lens applied to the fourteenth embodiment of the present invention.

[0144] In this case, the objective lens is used for an optical equipment which observes by the light of wavelength of the ultra-violet region of 300 nm or less and has the mechanism to focus (auto focus) by the light in the wavelength region from a visible region to the near-infrared region. Specifically, 248 nm in the deep-ultraviolet region as wavelength used for the observation and 633 nm in the visible region as wavelength used for auto focus are applied.

[0145] The objective lens has the first lens group 1G and the second lens group G2 arranged between the first lens group 1G and the object side as shown in FIG. 22. The first lens group 1G has four single lenses L21 to L24 which include positive lens and negative lens with the different medium and has negative power as a whole. The second lens group 2G has eight single lenses L25 to L32 which include positive lens and negative lens with the different medium. In the first and second lens groups 1G and 2G, the air interval is provided between a positive lens and negative lens.

[0146] Tables 16 to 19 show the angle of the light which is incident (emitted) to (from) the normal of the lens, reflectance and the transmittance, etc. corresponding thereto, which are obtained when two wavelength antireflection film explained in detail in the seventh embodiment is coated to each lens surface of each single lens L21 to L32 for each of NA=0.9, 0.8, 0.7, and 0.5 of such an objective lens, and the lens data of each single lens L21 to L32 (curvature, thickness, interval, and material name). TABLE 16 Surface Thickness and Incident number Curvature Interval Material Angle Reflectance Transmittance L₂₁ 1 −3.543 2.15 Quartz glass 31 0.4 0.996 2 6.765 0.10358 52 1.5 0.958 L₂₂ 3 6.181 3.06 Fluorite glass 55 2.06 0.979 4 −4.042 0.153241 53 4.6 0.954 L₂₃ 5 −4.08 0.92 Quartz glass 52 4 0.960 6 8.682 0.16626 54 2 0.980 L₂₄ 7 8.883 3.11 Fluorite glass 54 2 0.980 8 −6.824 0.106344 31 0.32 0.997 L₂₅ 9 24.853 0.9 Quartz glass 9 0.03 1.000 10 6.181 0.101063 55 3.54 0.965 L₂₆ 11 5.251 3.77 Fluorite glass 66 13 0.870 12 −9.936 0.61551 45 0.96 0.990 L₂₇ 13 −6.165 0.9 Quartz glass 58 5 0.950 14 6.165 0.502246 59 5.5 0.945 L₂₈ 15 8.596 2.78 Fluorite glass 49 1.2 0.988 16 −12.005 0.197219 17 0.47 0.995 L₂₉ 17 5.353 3.51 Fluorite glass 46 2.9 0.971 18 −11.031 0.488166 54 2 0.980 L₃₀ 19 −6.791 1.35 Quartz glass 65 7.52 0.925 20 −155.13 0.196741 14 0.01 1.000 L₃₁ 21 4.438 2.12 Quartz glass 23 0.22 0.998 22 13.067 0.095 19 0.15 0.999 L₃₂ 23 7.961 2.33 Quartz glass 30 2.58 0.974 24 10.691 0.2647.8 61 4.1 0.959

[0147] TABLE 17 Surface Thickness and Incident number Curvature Interval Material Angle Reflectance Transmittance L₂₁ 1 −3.543 2.15 Quartz glass 27 0.52 0.995 2 6.765 0.10358 44 1 0.990 L₂₂ 3 6.181 3.06 fluorite glass 46 1 0.990 4 −4.042 0.153241 44 1.3 0.987 L₂₃ 5 −4.08 0.92 Quartz glass 43 1.2 0.988 6 8.682 0.16626 46 1.2 0.988 L₂₄ 7 8.883 3.11 fluorite glass 46 1.2 0.988 8 −6.824 0.106344 27 0.48 0.995 L₂₅ 9 24.853 0.9 Quartz glass 9 0.01 1.000 10 6.181 0.101063 48 1.3 0.987 L₂₆ 11 5.251 3.77 fluorite glass 56 5 0.950 12 −9.936 0.61551 36 0.8 0.992 L₂₇ 13 −6.165 0.9 Quartz glass 47 1 0.990 14 6.165 0.502246 51 1.5 0.985 L₂₈ 15 8.596 2.78 Fluorite glass 43 0.85 0.992 16 −12.005 0.197219 16 0.4 0.996 L₂₉ 17 5.353 3.51 Fluorite glass 40 1.07 0.989 18 −11.031 0.488166 45 1.16 0.988 L₃₀ 19 −6.791 1.35 Quartz glass 54 5 0.950 20 −155.13 0.196741 14 0.01 1.000 L₃₁ 21 4.438 2.12 Quartz glass 18 0.43 0.996 22 13.067 0.095 18 0.1 0.999 L₃₂ 23 7.961 2.33 Quartz glass 22 0.6 0.994 24 10.691 0.2647.8 51 1.9 0.981

[0148] TABLE 18 Surface Thickness and Incident number Curvature Interval Material Angle Reflectance Transmittance L₂₁ 1 −3.543 2.562 Quartz glass 23 0.61 0.994 2 6.765 0.10358 37 0.83 0.992 L₂₂ 3 6.181 3.06 Fluorite glass 39 0.88 0.991 4 −4.042 0.153241 37 0.4 0.996 L₂₃ 5 −4.08 0.92 Quartz glass 36 0.4 0.996 6 8.682 0.16626 39 0.9 0.991 L₂₄ 7 8.883 3.11 Fluorite glass 39 0.9 0.991 8 −6.824 0.106344 23 0.61 0.994 L₂₅ 9 24.853 0.9 Quartz glass 8 0.01 1.000 10 6.181 0.101063 41 0.6 0.994 L₂₆ 11 5.251 3.77 Fluorite glass 47 1.2 0.988 12 −9.936 0.61551 29 0.62 0.994 L₂₇ 13 −6.165 0.9 Quartz glass 38 0.59 0.994 14 6.165 0.502246 43 0.7 0.992 L₂₈ 15 8.596 2.78 Fluorite glass 37 0.8 0.992 16 −12.005 0.197219 14 0.22 0.998 L₂₉ 17 5.353 3.51 Fluorite glass 34 0.33 0.997 18 −11.031 0.488166 38 0.85 0.992 L₃₀ 19 −6.791 1.35 Quartz glass 45 0.96 0.990 20 −155.13 0.196741 13 0.01 1.000 L₃₁ 21 4.438 2.12 Quartz glass 15 0.58 0.994 22 13.067 0.095 16 0.07 0.999 L₃₂ 23 7.961 2.33 Quartz glass 18 0.19 0.998 24 10.691 0.2647.8 43 1.15 0.989

[0149] TABLE 19 Surface Thickness and Incident number Curvature Interval Material Angle Reflectance Transmittance L₂₁ 1 −3.543 2.15 Quartz glass 16 0.4 0.996 2 6.765 0.10358 25 0.15 0.999 L₂₂ 3 6.181 3.06 Fluorite glass 26 0.4 0.996 4 −4.042 0.153241 25 0.64 0.994 L₂₃ 5 −4.08 0.92 Quartz glass 24 0.64 0.994 6 8.682 0.16626 26 0.4 0.996 L₂₄ 7 8.883 3.11 Fluorite glass 26 0.4 0.996 8 −6.824 0.106344 16 0.42 0.996 L₂₅ 9 24.853 0.9 Quartz glass 6 0.004 1.000 10 6.181 0.101063 28 0.65 0.994 L₂₆ 11 5.251 3.77 Fluorite glass 32 0.66 0.993 12 −9.936 0.61551 19 0.23 0.998 L₂₇ 13 −6.165 0.9 Quartz glass 26 0.6 0.994 14 6.165 0.502246 29 0.67 0.993 L₂₈ 15 8.596 2.78 Fluorite glass 25 0.46 0.995 16 −12.005 0.197219 10 0.07 0.999 L₂₉ 17 5.353 3.51 Fluorite glass 23 0.61 0.994 18 −11.031 0.488166 25 0.29 0.997 L₃₀ 19 −6.791 1.35 Quartz glass 30 0.61 0.994 20 −155.13 0.196741 9 0.01 1.000 L₃₁ 21 4.438 2.12 Quartz glass 10 0.39 0.996 22 13.067 0.095 11 0.01 1.000 L₃₂ 23 7.961 2.33 Quartz glass 12 0.57 0.994 24 10.691 0.2647.8 29 0.3 0.997

[0150] Thus, the transmittance at wavelength 248 nm and NA=0.9 shown in Table 16 becomes 50.6%. Similarly, the transmittance at wavelength 248 nm and NA=0.8 shown in Table 17 becomes 74.5%. The transmittance at wavelength 248 nm and NA=0.7 shown in Table 18 becomes 86.5%. The transmittance at wavelength 248 nm and NA=0.5 shown in Table 19 becomes 90.8%.

[0151] On the other hand, Tables 20 to 23 show the angle of the light which is incident (emitted) to (from) the normal of the lens, reflectance and the transmittance, etc. corresponding thereto, which are obtained when two wavelength antireflection film explained in detail in the first comparison example is provided to each lens surface of each single lens L21 to L32 for each of NA 0.9, 0.8, 0.7, and 0.5 of such an objective lens, and the lens data of each single lens L21 to L32 (curvature, thickness, interval, and material name). TABLE 20 Surface Thickness and Incident number Curvature Interval Material Angle Reflectance Transmittance L₂₁ 1 −3.543 2.15 Quartz glass 31 3.3 0.967 2 6.765 0.10358 52 7 0.930 L₂₂ 3 6.181 3.06 Fluorite glass 55 10 0.900 4 −4.042 0.153241 53 14 0.860 L₂₃ 5 −4.08 0.92 Quartz glass 52 14 0.860 6 8.682 0.16626 54 9 0.910 L₂₄ 7 8.883 3.11 Fluorite glass 54 9.3 0.907 8 −6.824 0.106344 31 3.9 0.961 L₂₅ 9 24.853 0.9 Quartz glass 9 0.01 1.000 10 6.181 0.101063 55 11.5 0.885 L₂₆ 11 5.251 3.77 Fluorite glass 66 22 0.780 12 −9.936 0.61551 45 4.2 0.958 L₂₇ 13 −6.165 0.9 Quartz glass 58 15 0.850 14 6.165 0.502246 59 16 0.840 L₂₈ 15 8.596 2.78 Fluorite glass 49 7.5 0.925 16 −12.005 0.197219 17 0.2 0.998 L₂₉ 17 5.353 3.51 Fluorite glass 46 12.5 0.975 18 −11.031 0.488166 54 7.5 0.925 L₃₀ 19 −6.791 1.35 Quartz glass 65 19.5 0.805 20 −155.13 0.196741 14 0.02 1.000 L₃₁ 21 4.438 2.12 Quartz glass 23 4 0.960 22 13.067 0.095 19 0.04 1.000 L₃₂ 23 7.961 2.33 Quartz glass 30 11 0.890 24 10.691 0.2647.8 61 9 0.910

[0152] TABLE 21 Surface Thickness and Incident number Curvature Interval Material Angle Reflectance Transmittance L₂₁ 1 −3.543 2.15 Quartz glass 27 2 0.980 2 6.765 0.10358 44 3.3 0.967 L₂₂ 3 6.181 3.06 Fluorite glass 46 4.3 0.957 4 −4.042 0.153241 44 10 0.900 L₂₃ 5 −4.08 0.92 Quartz glass 43 9 0.910 6 8.682 0.16626 46 4 0.960 L₂₄ 7 8.883 3.11 Fluorite glass 46 4 0.960 8 −6.824 0.106344 27 2 0.980 L₂₅ 9 24.853 0.9 Quartz glass 9 0.01 1.000 10 6.181 0.101063 48 9 0.910 L₂₆ 11 5.251 3.77 Fluorite glass 56 15 0.850 12 −9.936 0.61551 36 1.6 0.984 L₂₇ 13 −6.165 0.9 Quartz glass 47 8 0.920 14 6.165 0.502246 51 10 0.900 L₂₈ 15 8.596 2.78 Fluorite glass 43 4 0.960 16 −12.005 0.197219 16 0.1 0.999 L₂₉ 17 5.353 3.51 Fluorite glass 40 9 0.910 18 −11.031 0.488166 45 3 0.970 L₃₀ 19 −6.791 1.35 Quartz glass 54 10 0.900 20 −155.13 0.196741 14 0.02 1.000 L₃₁ 21 4.438 2.12 Quartz glass 18 1.9 0.981 22 13.067 0.095 18 0.03 1.000 L₃₂ 23 7.961 2.33 Quartz glass 22 7 0.930 24 10.691 0.2647.8 51 3 0.970

[0153] TABLE 22 Surface Thickness and Incident number Curvature Interval Material Angle Reflectance Transmittance L₂₁ 1 −3.543 2.15 Quartz glass 23 0.9 0.991 2 6.765 0.10358 37 1.2 0.988 L₂₂ 3 6.181 3.06 Fluorite glass 39 2 0.980 4 −4.042 0.153241 37 5.5 0.945 L₂₃ 5 −4.08 0.92 Quartz glass 36 5 0.950 6 8.682 0.16626 39 1.5 0.985 L₂₄ 7 8.883 3.11 Fluorite glass 39 1.5 0.985 8 −6.824 0.106344 23 1.95 0.981 L₂₅ 9 24.853 0.9 Quartz glass 8 0.01 1.000 10 6.181 0.101063 41 5 0.950 L₂₆ 11 5.251 3.77 Fluorite glass 47 9.5 0.905 12 −9.936 0.61551 29 0.55 0.995 L₂₇ 13 −6.165 0.9 Quartz glass 38 3.6 0.964 14 6.165 0.502246 43 5.5 0.945 L₂₈ 15 8.596 2.78 Fluorite glass 37 2 0.980 16 −12.005 0.197219 14 0.05 1.000 L₂₉ 17 5.353 3.51 Fluorite glass 34 5.3 0.947 18 −11.031 0.488166 38 1.2 0.988 L₃₀ 19 −6.791 1.35 Quartz glass 45 4.2 0.958 20 −155.13 0.196741 13 0.01 1.000 L₃₁ 21 4.438 2.12 Quartz glass 15 0.85 0.992 22 13.067 0.095 16 0.02 1.000 L₃₂ 23 7.961 2.33 Quartz glass 18 4.5 0.955 24 10.691 0.2647.8 43 1.6 0.984

[0154] TABLE 23 Surface Thickness and Incident number Curvature Interval Material Angle Reflectance Transmittance L₂₁ 1 −3.543 2.15 Quartz glass 16 0.1 0.999 2 6.765 0.10358 25 0.15 0.999 L₂₂ 3 6.181 3.06 Fluorite glass 26 0.2 0.998 4 −4.042 0.153241 25 0.85 0.992 L₂₃ 5 −4.08 0.92 Quartz glass 24 0.85 0.992 6 8.682 0.16626 26 0.2 0.998 L₂₄ 7 8.883 3.11 Fluorite glass 26 0.2 0.998 8 −6.824 0.106344 16 0.15 0.999 L₂₅ 9 24.853 0.9 Quartz glass 6 0.01 1.000 10 6.181 0.101063 28 0.75 0.993 L₂₆ 11 5.251 3.77 Fluorite glass 32 1.8 0.982 12 −9.936 0.61551 19 0.07 0.999 L₂₇ 13 −6.165 0.9 Quartz glass 26 0.45 0.996 14 6.165 0.502246 29 0.7 0.993 L₂₈ 15 8.596 2.78 Fluorite glass 25 0.24 0.998 16 −12.005 0.197219 10 0.02 1.000 L₂₉ 17 5.353 3.51 Fluorite glass 23 0.85 0.992 18 −11.031 0.488166 25 0.13 0.999 L₃₀ 19 −6.791 1.35 Quartz glass 30 0.47 0.995 20 −155.13 0.196741 9 0.01 1.000 L₃₁ 21 4.438 2.12 Quartz glass 10 0.1 0.999 22 13.067 0.095 11 0.01 1.000 L₃₂ 23 7.961 2.33 Quartz glass 12 0.8 0.992 24 10.691 0.2647.8 29 0.19 0.998

[0155] Thus, the transmittance at wavelength 248 nm and NA=0.9 shown in Table 20 becomes 105%. Similarly, the transmittance at wavelength 248 nm and NA=0.8 shown in Table 21 becomes 28.5%. The transmittance at wavelength 248 nm and NA=0.7 shown in Table 22 becomes 52.2%. The transmittance at wavelength 248 nm and NA=0.5 shown in Table 23 becomes 91.1%.

[0156] As a result, when comparing the transmittance of the objective lens of the seventh embodiment in which two wavelength antireflection film is coated and the objective lens of the first comparison example in which two wavelength antireflection film is coated with each lens surface of each single lens L21 to L32, when two wavelength antireflection film of the ninth embodiment as shown in FIG. 23 is coated, high transmittance can be obtained even in a case that NA is 0.8, and 0.9 as shown in curve A. In contrast, when two-wavelength antireflection film of the second comparison example is coated, it is apparent that transmittance reduces rapidly as shown in curve B as NA becomes large such as 0.7, 0.8, 0.9 as shown in curve B. As a result, high transmittance in 248 nm used for the observation and a high NA, that is, high resolutions can be achieved by coating two-wavelength antireflection film according to the ninth embodiment to each lens surface of each single lens L21 to L32 which configures the objective lens.

[0157] As mentioned above, according to the embodiment of the present invention, the antireflection effect can be achieved in the vicinity of 248 nm and the wavelength region of 600 to 800 nm for substrate (lens) material whose refractive index in the deep-ultraviolet region is 1.4 to 1.52. Even when the incident angle of light becomes large, the antireflection effect is never lost in the vicinity of especially 248 nm. Therefore, high transmittance can be achieved even when the incident angle of the light to the surface of the lens is from vertical to about 65°.

[0158] A high antireflection effect can be achieved according to the embodiment of the present invention when applying to quartz glass and fluorite glass which are transparent material in the deep-ultraviolet region used well, especially 248 nm wavelength.

[0159] It is preferable the material of refractive index of 1.35 to 1.5 in the deep-ultraviolet region is used as a low refractive index material according to the embodiment of the present invention. Especially, a higher effect can be achieved by using one or more component chosen by the group of MgF₂, SiO₂, NaF, LiF, and mixture or compound thereof as a material with excellent productivity and a little absorption film in the low refractive index. Among these, MgF₂ and SiO₂, which have withstand extreme environmental conditions and can be easily obtained, is easy to use for production the effect is high. A high antireflection characteristic can be obtained by using MgF₂ to the low refraction layer of the fourth layer (surface layer) from the substrate caused by the low refractive index thereof. Similarly, It is preferable the material is used as the middle refractive index material whose the refractive index in the deep-ultraviolet region is 1.6 to 1.9. Especially, a higher effect can be achieved by using one or more component chosen by the group of Al₂O₃, CaF₃, NdF₃, YF₃, La₂O₃, and mixture or compound thereof as a material with excellent productivity and a little absorption film in the low refractive index.

[0160] According to the embodiment of the present invention, when the visible or the near-infrared wavelength (auto focus wavelength), which performs antireflection, is within the rage of 650 to 800 nm, the above-mentioned effect can be achieved by setting the range of the film thickness of the first layer from the substrate to 0.4λ≦nd1≦0.6λ, that of the second layer to 0.4λ≦nd2≦0.6λ, that of the third layer to 0.1λ<nd3≦0.3λ, and that of the fourth layer to 0.2λnd4≦0.35λ, for wavelength λ (λ=248 nm). In addition, when the range of the film thickness of the first to fourth layer from the substrate are set to 0.4λ≦nd1≦0.6λ, 0.4λ≦nd2≦0.6λ, 0.2λ≦nd3≦0.3λ, and 0.2λ≦nd4≦0.3λ, respectively, two wavelength antireflection film with high antireflection performance can be obtained in the combination of film material with high refractive index stability and excellent productivity (MgF₂, La₂O₃, and Al₂O₃ mixture material). When the auto focus wavelength is selected in the vicinity of 750 nm, a higher effect can be obtained according to such a range of the film thickness.

[0161] Similarly, when auto focus wavelength is in 650 to 800 nm, the above-mentioned effect can be achieved by setting the range of the film thickness of the first layer from the substrate to 0.5λ≦nd1≦0.7λ, that of the second layer to 0.05λ≦nd2≦0.2λ, that of the third layer to 0.25λ≦nd3≦0.5λ, and that of the fourth layer to 0.2λ≦nd4≦0.35λ, for wavelength λ (λ=248 nm). In addition, when the range of the film thickness of the first to fourth layer from the substrate are set to 0.6λ≦nd1≦0.7λ, 0.05λ≦nd2≦0.1λ, 0.25λ≦nd3≦0.35λ, and 0.25λ<nd4≦0.35λ, respectively, two wavelength antireflection film with high antireflection performance can be obtained in the combination of film material with high refractive index stability and excellent productivity (MgF₂, La₂O₃, and Al₂O₃ mixture material). When the auto focus wavelength is selected in the vicinity of 750 nm, a higher effect can be obtained according to such a range of the film thickness.

[0162] In the objective lens used for the microscope, which observes by the light of wavelength of the ultraviolet region of 300 nm or less and has the focusing mechanism (auto focus) in the wavelength from the visible region to the near-infrared region, high transmittance and a high NA, that is, high resolving power can be achieved.

[0163] The present invention is not limited to the above-described embodiments. Various modifications can occur at its embodying stage without departing from the scope of the invention.

[0164] In addition, for example, even if some of all the constituent elements shown in the embodiments are deleted, in the case where the problems described in the Brief Summary of the Invention section can be solved, and advantageous effect described in the Advantageous Effect of the Invention section can be achieved, the configuration can be excerpted after these constituent elements have been deleted.

[0165] As mentioned above, according to the present invention, two-wavelength antireflection film in which high transmittance can be achieved in a deep-ultraviolet region and from the visible region to the near-infrared region, and the objective lens on which two-wavelength antireflection film is coated can be achieved.

[0166] Additional advantages and modifications will readily occur to those skilled in the art. Therefore, the present invention in its broader aspects is nor limited to the specific details, representative devices, and illustrated examples shown and described herein. Accordingly, various modifications may be made without departing from the spirit or scope of the general inventive concept as defined by the appended claims and their equivalents. 

1. A two-wavelength antireflection film for antireflection in two-wavelength regions of light between 200 nanometers and 850 nanometers wherein one of the two-wavelength regions ranges from about 200 nanometers to 350 nanometers and includes a design main wavelength and the other two-wavelength region extends from about 650 nanometers to 850 nanaometers comprising: a substrate which is transparent in wavelength regions in which the substrate is to be used; a first thin film which is formed on the substrate, and has a refractive index of 1.6 to 2.0 and optical film thickness of 0.4λ to 0.7λ for the design main wavelength (λ); a second thin film which is formed on the first thin film, and has a refractive index of 1.35 to 1.55 and an optical film thickness of 0.05λto 0.6λ for the design main wavelength λ; a third thin film which is formed on the second thin film, and has a refractive index of 1.6 to 2.0 and an optical film thickness of 0.1λ to 0.5λ for the design main wavelength λ; and a fourth thin film which is formed on the third thin film, and has a refractive index of 1.35 to 1.55 and optical film thickness of 0.2λ to 0.35λ for design main wavelength λ.
 2. The two-wavelength antireflection film according to claim 1, wherein, the substrate is quartz glass or fluorite glass.
 3. The two-wavelength antireflection film according to claim 1, wherein, the first thin film and the third thin film contain material which has a plurality of components chosen by a group of Al₂O₃, LaF₃, NdF₃, YF₃, La₂O₃, and mixture or compound thereof, and the second thin film and the fourth thin film contain material which has a plurality of components chosen by a group of MgF₂, S_(i)O₂, NaF, LiF, and mixture or compound thereof.
 4. The two-wavelength antireflection film according to claim 1, wherein an incident angle of the light of the design main wavelength is set within a range of 0° to 70°.
 5. The two-wavelength antireflection film according to claim 1, wherein the design main wavelength is 248 nm.
 6. The two-wavelength antireflection film according to claim 5, wherein a wavelength which performs antireflection includes two wavelength regions of a wavelength in vicinity of main design wavelength and a wavelength from 650 to 800 nm, an optical film thickness of the first thin film is 0.4λ to 0.6λ, an optical film thickness of the second thin film is 0.4λ to 0.6λ, an optical film thickness of the third thin film is 0.1λ to 0.3λ, and an optical film thickness of the fourth thin film is from 0.35λ to 0.2λ.
 7. The two-wavelength antireflection film according to claim 5, wherein, a wavelength which performs antireflection includes two wavelength regions of a wavelength in vicinity of main design wave length and a wavelength in the vicinity of 750 nm, the first thin film and the third thin film include mixture of Al₂O₃ and La₂O₃, and the second thin film and fourth thin film include MgF₂, an optical film thickness of the first thin film is 0.4λ to 0.6λ, an optical film thickness of the second thin film is 0.4λ to 0.6λ, an optical film thickness of the third thin film is 0.2λ to 0.3λ, and an optical film thickness of the fourth thin film is 0.2λ to 0.3×.
 8. The two-wavelength antireflection film according to claim 5, wherein, a wavelength which performs antireflection includes two wavelength regions of a wavelength in vicinity of main design wavelength and a wavelength from 550 to 650 nm, an optical film thickness of the first thin film is 0.5λ to 0.7λ, an optical film thickness of the second thin film is 0.05λ to 0.2λ, an optical film thickness of the third thin film is 0.25λ to 0.5λ, and an optical film thickness of the fourth thin film is 0.2λ to 0.35λ.
 9. The two-wavelength antireflection film according to claim 5, wherein a wavelength which performs antireflection includes two wavelength regions of a wavelength in vicinity of main design wave length and a wavelength in vicinity of 600 nm, the first thin film and the third thin film include mixture of Al₂O₃, and La₂O₃, and the second thin film and fourth thin film include MgF₂, an optical film thickness of the first thin film is 0.6λ to 0.7λ, an optical film thickness of the second thin film is 0.05λ to 0.1λ, an optical film thickness of the third thin film is 0.25λ to 0.35λ, and an optical film thickness of the second thin film is 0.25λ to 0.35λ.
 10. An objective lens used for an optical equipment, which performs an observation by the light of the deep-ultraviolet region wavelength of 300 nm or less and has a focusing mechanism (auto focus) in the wavelength region from a visible region to a near-infrared region, comprising a plurality of single lenses, wherein each of the plurality of single lenses has a two-wavelength antireflection film according to claim 1 on the surface thereof.
 11. The objective lens according to claim 10, further comprising a first lens group which contains a plurality of single lenses having positive lens and negative lens whose medium are different from each other and has negative power as a whole; and a second lens group which is arranged from the first lens group to the object side, and contains a plurality of single lenses having positive lens and negative lens whose medium are different form each other, wherein the first and second lens groups have air intervals between the positive lens and negative lens, respectively, and a numerical aperture is 0.7 or more. 